Generative adversarial network (GAN) enabled on-chip contact microscopy

Abstract

We demonstrate a deep learning based contact imaging on a CMOS chip to achieve [~]1 m spatial resolution over a large field of view of [~]24 mm2. By using regular LED illumination, we acquire the single lower-resolution image of the objects placed approximate to the sensor with unit fringe magnification. For the raw contact-mode lens-free image, the pixel size of the sensor chip limits the spatial resolution. We apply a generative and adversarial network (GAN), a type of deep learning algorithm, to circumvent this limitation and effectively recover much higher resolution image of the objects, permitting sub-micron spatial resolution to be achieved across the entire sensor chip active area, which is also equivalent to the imaging field-of-view (24 mm2) due to unit magnification. This GAN-contact imaging approach eliminates the need of either lens or multi-frame acquisition, being very handy and cost-effective. We demonstrate the success of this approach by imaging the proliferation dynamics of cells directly cultured on the chip.