EM-net: Deep learning for electron microscopy image segmentation

Abstract

Recent high-throughput electron microscopy techniques such as focused ion-beam scanning electron microscopy (FIB-SEM) provide thousands of serial sections which assist the biologists in studying sub-cellular structures at high resolution and large volume. Low contrast of such images hinder image segmentation and 3D visualisation of these datasets. With recent advances in computer vision and deep learning, such datasets can be segmented and reconstructed in 3D with greater ease and speed than with previous approaches. However, these methods still rely on thousands of ground-truth samples for training and electron microscopy datasets require significant amounts of time for carefully curated manual annotations. We address these bottlenecks with EM-net, a scalable deep convolutional neural network for EM image segmentation. We have evaluated EM-net using two datasets, one of which belongs to an ongoing competition on EM stack segmentation since 2012. We show that EM-net variants achieve better performances than current deep learning methods using small- and medium-sized ground-truth datasets. We also show that the ensemble of top EM-net base classifiers outperforms other methods across a wide variety of evaluation metrics.