@misc{indiciae76e6e686172d,
  title = {Fully automated, sequential focused ion beam milling for cryo-electron tomography},
  author = {Zachs, T. and Medeiros, J. M. and Schertel, A. and Weiss, G. L. and Hugener, J. and Pilhofer, M.},
  year = {2019},
  doi = {10.1101/797514},
  url = {https://www.biorxiv.org/content/10.1101/797514v1},
  note = {Source identifier: 10.1101/797514}
}