@misc{indiciae260920a05f39,
  title = {Exploring the potential for scanning electron microscopy/focused ion beam - based diffraction for screening cryo-transmission electron microscopy samples},
  author = {Woods, E. V. and Wigge, C. and Zhao, Y. and de Kloe, R. and Schwarz, T. M. and Britton, B. and Zaefferer, S. and Gault, B.},
  year = {2025},
  doi = {10.1101/2025.09.25.678486},
  url = {https://www.biorxiv.org/content/10.1101/2025.09.25.678486v1},
  note = {Source identifier: 10.1101/2025.09.25.678486}
}