TY  - RPRT
TI  - On the Stability of Silicone-Encapsulated CMOS ICs for Active Implantable Devices: 4.3 Years of Accelerated Life Testing
AU  - Shah Idil, A.
AU  - Lamont, C.
AU  - Nanbakhsh, K.
AU  - Mazza, F.
AU  - Giagka, V.
AU  - Constandinou, T.
AU  - Vanhoestenberghe, A.
AU  - Donaldson, N.
PY  - 2025
DO  - 10.1101/2025.05.21.655306
UR  - https://www.biorxiv.org/content/10.1101/2025.05.21.655306v1
ID  - 10.1101/2025.05.21.655306
ER  -